Artola, L.L.ArtolaNuns, T.T.NunsCussac, G.G.CussacChiarella, ThomasThomasChiarellaMitard, JeromeJeromeMitard2022-06-282022-06-252022-06-2820212154-0519WOS:000802055000024https://imec-publications.be/handle/20.500.12860/40023Total Ionizing Dose Effects of n-FinFET Transistor in iN14 TechnologyProceedings paper10.1109/NSREC45046.2021.9679337978-1-6654-4205-3WOS:000802055000024VARIABILITY