Breuil, LaurentLaurentBreuilHaspeslagh, LucLucHaspeslaghLorenzini, MartinoMartinoLorenziniDe Vos, JoeriJoeriDe VosVan Houdt, JanJanVan Houdt2021-10-162021-10-162005-11https://imec-publications.be/handle/20.500.12860/10153Scaling effects in dual-bit split-gate memory devicesJournal article