Houssa, MichelMichelHoussaDe Gendt, StefanStefanDe Gendtde Bokx, P.P.de BokxMertens, PaulPaulMertensHeyns, MarcMarcHeyns2021-10-062021-10-061999https://imec-publications.be/handle/20.500.12860/3518X-ray irradiation effect on the reliability of ultra-thin gate oxides and oxynitridesJournal article