Kinetic defect distribution approach for modeling the transient, endurance and retention of a-VMCO RRAM

Subhechha, SubhaliSubhaliSubhechhaDegraeve, RobinRobinDegraeveRoussel, PhilippePhilippeRousselGoux, LudovicLudovicGouxClima, SergiuSergiuClimaDe Meyer, KristinKristinDe MeyerVan Houdt, JanJanVan HoudtKar, Gouri SankarGouri SankarKar2021-10-242021-10-242017https://imec-publications.be/handle/20.500.12860/29517Kinetic defect distribution approach for modeling the transient, endurance and retention of a-VMCO RRAMProceedings paperhttp://ieeexplore.ieee.org/document/7936322/