Hantschel, ThomasThomasHantschelZimmer, JerryJerryZimmerMoussa, AlainAlainMoussaOlanterae, LauriLauriOlanteraeClemente, FrancescaFrancescaClementeGeypen, JefJefGeypenBender, HugoHugoBenderVandervorst, WilfriedWilfriedVandervorst2021-10-182021-10-182010https://imec-publications.be/handle/20.500.12860/17222Characterization of boron-doped diamond films for application in nanoscale electrical measurementsProceedings paper