A new method for measuring the saturation velocity of submicron CMOS transistors

Schreutelkamp, RobRobSchreutelkampDeferm, LudoLudoDeferm2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/859A new method for measuring the saturation velocity of submicron CMOS transistorsJournal article