Diaz Fortuny, JavierJavierDiaz FortunyNayar, VishalVishalNayar2025-08-032025-08-0320251530-1591WOS:001506972600153https://imec-publications.be/handle/20.500.12860/46021Transistor Aging and Circuit Reliability at Cryogenic TemperaturesProceedings paper978-3-9826741-0-0WOS:001506972600153