Tallarico, AndreaAndreaTallaricoStoffels, SteveSteveStoffelsPosthuma, NielsNielsPosthumaBakeroot, BenoitBenoitBakerootDecoutere, StefaanStefaanDecoutereSangiorgi, EESangiorgiFiegna, CCFiegna2021-10-272021-10-2720190018-9383https://imec-publications.be/handle/20.500.12860/34101Gate reliability of p-GaN HEMT with gate metal retractionJournal articlehttps://ieeexplore.ieee.org/document/8842623