Lin, L.L.LinJi, ZhigangZhigangJiZhang, Jian FuJian FuZhangZhang, Wei DongWei DongZhangKaczer, BenBenKaczerDe Gendt, StefanStefanDe GendtGroeseneken, GuidoGuidoGroeseneken2021-10-192021-10-1920110018-9383https://imec-publications.be/handle/20.500.12860/19304A single pulse charge pumping technique for fast measurements of interface statesJournal article