Impact of lateral and vertical scaling on the reliability of a low-complexity 200 GHz SiGe: CHBT

Piontek, AndreasAndreasPiontekChoi, Li JenLi JenChoiVan Huylenbroeck, StefaanStefaanVan HuylenbroeckVanhoucke, T.T.VanhouckeHijzen, E.E.HijzenDecoutere, StefaanStefaanDecoutere2021-10-162021-10-162005https://imec-publications.be/handle/20.500.12860/11020Impact of lateral and vertical scaling on the reliability of a low-complexity 200 GHz SiGe: CHBTProceedings paper