Electrical properties of CuTCNQ based organic memories targeting integration in the CMOS back end-of-line

Muller, RobertRobertMullerBillen, JorisJorisBillenNaulaerts, RikRikNaulaertsRouault, OlivierOlivierRouaultGoux, LudovicLudovicGouxWouters, DirkDirkWoutersGenoe, JanJanGenoeHeremans, PaulPaulHeremans2021-10-162021-10-162007-04https://imec-publications.be/handle/20.500.12860/12600Electrical properties of CuTCNQ based organic memories targeting integration in the CMOS back end-of-lineProceedings paper