Influence of the accumulation back-gate voltage on the noise spectra of deep submicron SOI MOSFET's in a wide range of drain voltages

Kudina, V.V.KudinaLukyanchikova, N.N.LukyanchikovaGarbar, N.N.GarbarSmolanka, A.A.SmolankaSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-172021-10-1720082071-0186https://imec-publications.be/handle/20.500.12860/13965Influence of the accumulation back-gate voltage on the noise spectra of deep submicron SOI MOSFET's in a wide range of drain voltagesJournal article