Low-temperature admittance spectroscopy for defect characterization in Cu(In,Ga)(S,Se)2 thin-film solar cells

Parion, JonathanJonathanParionScaffidi, RomainRomainScaffidiBrammertz, GuyGuyBrammertzVermang, BartBartVermangFlandre, DenisDenisFlandre2025-05-142023-09-202025-05-142023-08-07978-1-6654-6396-6N/Ahttps://imec-publications.be/handle/20.500.12860/42570Low-temperature admittance spectroscopy for defect characterization in Cu(In,Ga)(S,Se)2 thin-film solar cellsProceedings paper10.1109/EUROCON56442.2023.10199008978-1-6654-6397-3Electrical & electronic engineeringAdmittance spectroscopyCIGSThin-film PV