Identification of isolation-edge related random telegraph signals in submicron silicon metal-oxide-semiconductor transistors

Lukyanchikova, N.N.LukyanchikovaPetrichuk, M. V.M. V.PetrichukGarbar, N.N.GarbarSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-09-302021-09-301997https://imec-publications.be/handle/20.500.12860/2004Identification of isolation-edge related random telegraph signals in submicron silicon metal-oxide-semiconductor transistorsJournal article