Radiation hardness aspects of advanced FinFET and UTBOX devices

Claeys, CorCorClaeysAoulaiche, MarcMarcAoulaicheSimoen, EddyEddySimoenGriffoni, AlessioAlessioGriffoniKobayashi, D.D.KobayashiMahatme, N.N.N.N.MahatmeReed, R.A.R.A.ReedSchrimpf, R.D.R.D.SchrimpfAgopian, P.G.D.P.G.D.AgopianMartino, J.A.J.A.Martino2021-10-202021-10-202012https://imec-publications.be/handle/20.500.12860/20476Radiation hardness aspects of advanced FinFET and UTBOX devicesProceedings paper