Evidences of electrode-controlled retention properties in Ta2O5-based resistive-switching memory cells

Goux, LudovicLudovicGouxFantini, AndreaAndreaFantiniChen, YangyinYangyinChenRedolfi, AugustoAugustoRedolfiDegraeve, RobinRobinDegraeveJurczak, GosiaGosiaJurczak2021-10-222021-10-2220142162-8726https://imec-publications.be/handle/20.500.12860/23870Evidences of electrode-controlled retention properties in Ta2O5-based resistive-switching memory cellsJournal articlehttp://ssl.ecsdl.org/content/3/11/Q79.short?rss=1