Simplistic simulation-based device-VT-targeting technique to determine technology high-density LELE-gate-patterned FinFET SRAM in sub-10 nm era

Sakhare, SushilSushilSakhareMiyaguchi, KenichiKenichiMiyaguchiRaghavan, PraveenPraveenRaghavanMercha, AbdelkarimAbdelkarimMercha2021-10-222021-10-2220150018-9383https://imec-publications.be/handle/20.500.12860/25851Simplistic simulation-based device-VT-targeting technique to determine technology high-density LELE-gate-patterned FinFET SRAM in sub-10 nm eraJournal articlehttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6980098