Marcon, DenisDenisMarconViaene, JohnJohnViaeneFavia, PaolaPaolaFaviaBender, HugoHugoBenderKang, XuanwuXuanwuKangLenci, SilviaSilviaLenciStoffels, SteveSteveStoffelsDecoutere, StefaanStefaanDecoutere2021-10-202021-10-2020120026-2714https://imec-publications.be/handle/20.500.12860/21094Reliability of AlGaN/GaN HEMTs: permanent leakage current increase and output current dropJournal articlehttp://dx.doi.org/10.1016/j.microrel.2012.06.052