Ohyama, H.H.OhyamaTakakura, T.T.TakakuraSimoen, EddyEddySimoenClaeys, CorCorClaeysUemura, J.J.UemuraKishikawa, T.T.Kishikawa2021-10-142021-10-142002https://imec-publications.be/handle/20.500.12860/6663Radiation damage of Si photodiodes by high-temperature irradiationOral presentation