Liquid helium temperature irradiation effects on 0.7 μm CMOS devices for cryogenic space applications

Mercha, AbdelkarimAbdelkarimMerchaCreten, YbeYbeCretenPutzeys, JanJanPutzeysDe Moor, PietPietDe MoorClaeys, CorCorClaeysVan Hoof, ChrisChrisVan HoofSimoen, EddyEddySimoenMohammazadeh, A.A.MohammazadehNickson, R.R.Nickson2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/7890Liquid helium temperature irradiation effects on 0.7 μm CMOS devices for cryogenic space applicationsMeeting abstract