Root-cause analysis of device failure in inverted P3HT:PCBM cells

Voroshazi, EszterEszterVoroshaziUytterhoeven, GrietGrietUytterhoevenFavia, PaolaPaolaFaviaCnops, KjellKjellCnopsCheyns, DavidDavidCheyns2021-10-212021-10-212013https://imec-publications.be/handle/20.500.12860/23364Root-cause analysis of device failure in inverted P3HT:PCBM cellsProceedings paper