Verhaege, KoenKoenVerhaegeRuss, ChristianChristianRussLuchies, J. M.J. M.LuchiesGroeseneken, GuidoGuidoGroesenekenKuper, F. G.F. G.Kuper2021-09-302021-09-301997https://imec-publications.be/handle/20.500.12860/2285Grounded-gate nMOS transistor behaviour under CDM ESD stress conditionsJournal article