Arreghini, AntonioAntonioArreghiniZahid, MohammedMohammedZahidVan den Bosch, GeertGeertVan den BoschSuhane, AmitAmitSuhaneBreuil, LaurentLaurentBreuilCacciato, AntonioAntonioCacciatoVan Houdt, JanJanVan Houdt2021-10-192021-10-1920110167-9317https://imec-publications.be/handle/20.500.12860/18492Effect of high temperature annealing on tunnel oxide properties in TANOS devicesJournal article