Zanoni, EnricoEnricoZanoniMeneghini, MatteoMatteoMeneghiniStocco, AntonioAntonioStoccoMarcon, DenisDenisMarconBertin, MarcoMarcoBertinSilvestri, RiccardoRiccardoSilvestriFerretti, MarcoMarcoFerrettiRampazzo, FabianaFabianaRampazzoMeneghesso, GaudenzioGaudenzioMeneghesso2021-10-202021-10-202012https://imec-publications.be/handle/20.500.12860/21909Degradation mechanisms in AlGaN/GaN HEMTs submitted to off and on-state stress conditionsProceedings paper