Role of holes and electrons during erase of TANOS memories: evidence for dipole formation and its impact on reliability

Vandelli, LucaLucaVandelliArreghini, AntonioAntonioArreghiniPadovani, AndreaAndreaPadovaniLarcher, LucaLucaLarcherVan den Bosch, GeertGeertVan den BoschDella Marca, VincenzoVincenzoDella MarcaPavan, PaoloPaoloPavanJurczak, GosiaGosiaJurczakVan Houdt, JanJanVan Houdt2021-10-182021-10-182010https://imec-publications.be/handle/20.500.12860/18209Role of holes and electrons during erase of TANOS memories: evidence for dipole formation and its impact on reliabilityProceedings paper