Thermal source separation for 3D defect localization using independent component analysis (ICA) from time-resolved temperature response (TRTR)

Koegel, MichaelMichaelKoegelBrand, SebastianSebastianBrandGrosse, ChristianChristianGrosseJacobs, Kristof J.P.Kristof J.P.JacobsDe Wolf, IngridIngridDe WolfAltmann, FrankFrankAltmann2023-08-082023-06-202023-08-0820212161-8070WOS:000878693200051https://imec-publications.be/handle/20.500.12860/42063Thermal source separation for 3D defect localization using independent component analysis (ICA) from time-resolved temperature response (TRTR)Proceedings paper10.1109/CASE49439.2021.9551575978-1-6654-1873-7WOS:000878693200051