Transverse probe optical lifetime measurement as a tool for in-line characterization of the fabrication process of a silicon solar cell

Irace, A.A.IraceSirleto, L.L.SirletoVitale, G. F.G. F.VitaleCutolo, A.A.CutoloZeni, L.L.ZeniHorzel, JörgJörgHorzelSzlufcik, JozefJozefSzlufcik2021-10-062021-10-061999https://imec-publications.be/handle/20.500.12860/3529Transverse probe optical lifetime measurement as a tool for in-line characterization of the fabrication process of a silicon solar cellJournal article