He, LiangLiangHeSimoen, EddyEddySimoenClaeys, CorCorClaeysWang, GuileiGuileiWangLuo, JunJunLuoZhao, ChaoChaoZhaoLi, JunfengJunfengLiChen, HuaHuaChenHu, YinYinHuQin, XiaotingXiaotingQin2021-10-242021-10-242017https://imec-publications.be/handle/20.500.12860/28476Low frequency noise characterization of 22nm PMOS featuring with filling W gate using different precursorsProceedings paperhttps://ieeexplore.ieee.org/document/7919856/