Simoen, EddyEddySimoenEneman, GeertGeertEnemanVerheyen, PeterPeterVerheyenDelhougne, RomainRomainDelhougneRooyackers, RitaRitaRooyackersLoo, RogerRogerLooVandervorst, WilfriedWilfriedVandervorstDe Meyer, KristinKristinDe MeyerClaeys, CorCorClaeys2021-10-162021-10-162005-05https://imec-publications.be/handle/20.500.12860/11210The low-frequency noise in n-MOSFETs on strained silicon: Is there room for improvement?Proceedings paper