Dos Santos, S.D.S.D.Dos SantosNicoletti, TalithaTalithaNicolettiMartino, J.A.J.A.MartinoSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-182021-10-182010https://imec-publications.be/handle/20.500.12860/17038DIBL behavior of triple gate FinFETs with SEG on biaxial strained devicesProceedings paper