Goes, WolfgangWolfgangGoesSchanovsky, FranzFranzSchanovskyGrasser, TiborTiborGrasserReisinger, HansHansReisingerKaczer, BenBenKaczer2021-10-192021-10-192011-06https://imec-publications.be/handle/20.500.12860/18966Advanced modeling of oxide defects for random telegraph noiseProceedings paper