Ohyama, HidenoriHidenoriOhyamaVanhellemont, JanJanVanhellemontTakami, Y.Y.TakamiHayama, KiyoteruKiyoteruHayamaKudo, T.T.KudoHakata, T.T.HakataKobayashi, K.K.KobayashiSunaga, H.H.SunagaHironaka, I.I.HironakaPoortmans, JefJefPoortmansCaymax, MattyMattyCaymax2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/794Degradation and recovery of Si1-xGex devices by irradiationProceedings paper