Reliability sssessment of integrated power transistors: lateral DMOS versus vertical DMOS

Moens, PeterPeterMoensVan den Bosch, GeertGeertVan den Bosch2021-10-172021-10-1720080026-2714https://imec-publications.be/handle/20.500.12860/14182Reliability sssessment of integrated power transistors: lateral DMOS versus vertical DMOSJournal article