A unified hot carrier degradation model for integrated lateral and vertical nDMOS transistors

Moens, P.P.MoensVan den Bosch, GeertGeertVan den BoschGroeseneken, GuidoGuidoGroesenekenBolognesi, D.D.Bolognesi2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/7908A unified hot carrier degradation model for integrated lateral and vertical nDMOS transistorsProceedings paper