El-Mamouni, F.F.El-MamouniZhang, X.X.ZhangBall, D.R.D.R.BallSierawski, B.B.SierawskiKing, M.P.M.P.KingSchrimpf, R.D.R.D.SchrimpfReed, R.A.R.A.ReedAlles, M.L.M.L.AllesFleetwood, D.M.D.M.FleetwoodLinten, DimitriDimitriLintenSimoen, EddyEddySimoenVizkelethy, G.G.Vizkelethy2021-10-202021-10-2020120018-9499https://imec-publications.be/handle/20.500.12860/20647Heavy-ion-induced current transients in bulk and SOI FinFETsJournal article