Simoen, EddyEddySimoenVanhellemont, JanJanVanhellemontAlaerts, AndréAndréAlaertsClaeys, CorCorClaeysGaubas, EugenijusEugenijusGaubasKaniava, ArvydasArvydasKaniavaOhyama, HidenoriHidenoriOhyamaSunaga, H.H.SunagaNahsiyama, I.I.NahsiyamaSkorupa, W.W.Skorupa2021-09-302021-09-301997https://imec-publications.be/handle/20.500.12860/2147Proton irradiation effects in silicon junction diodes and charge-coupled devicesJournal article