Low-frequency noise spectroscopy of bulk and border traps in nanoscale devices

Simoen, EddyEddySimoenCretu, BogdanBogdanCretuFang, WenWenFangAoulaiche, MarcMarcAoulaicheRoutoure, Jean-MarcJean-MarcRoutoureCarin, RegisRegisCarinLuo, JunJunLuoZhao, ChaoChaoZhaoClaeys, CorCorClaeys2021-10-232021-10-232016https://imec-publications.be/handle/20.500.12860/27312Low-frequency noise spectroscopy of bulk and border traps in nanoscale devicesProceedings paperhttp://www.scientific.net/SSP.242.449