Simoen, EddyEddySimoenHsu, BrentBrentHsuMols, YvesYvesMolsKunert, BernardetteBernardetteKunertLanger, RobertRobertLangerMerckling, ClementClementMercklingAlian, AliRezaAliRezaAlianWaldron, NiamhNiamhWaldronEneman, GeertGeertEnemanCollaert, NadineNadineCollaertHeyns, MarcMarcHeynsClaeys, CorCorClaeys2021-10-272021-10-272019https://imec-publications.be/handle/20.500.12860/34008Electrical activity of extended defects in III-V semiconductorsProceedings paperhttp://ecst.ecsdl.org/content/92/4/21.abstract