Low temperature noise spectroscopy of 0.1 μm partially depleted silicon on insulator metal-oxide-semiconductor field effect transistors

Lartigau, I.I.LartigauRoutoure, J.M.J.M.RoutoureGuo, W.W.GuoCretu, B.B.CretuCarin, R.R.CarinMercha, AbdelkarimAbdelkarimMerchaClaeys, CorCorClaeysSimoen, EddyEddySimoen2021-10-162021-10-162007https://imec-publications.be/handle/20.500.12860/12437Low temperature noise spectroscopy of 0.1 μm partially depleted silicon on insulator metal-oxide-semiconductor field effect transistorsJournal article