Kilchytska, ValeriaValeriaKilchytskaKazemi Esfeh, BabakBabakKazemi EsfehGimeno, C.C.GimenoParvais, BertrandBertrandParvaisPlanes, N.N.PlanesHaond, M.M.HaondRaskin, J-PJ-PRaskinFlandre, DenisDenisFlandre2021-10-242021-10-242017https://imec-publications.be/handle/20.500.12860/28678Comparative study of non-linearities in 28 nm node FDSOI and Bulk MOSFETsProceedings paperhttp://ieeexplore.ieee.org/document/7962578/