Al-Kofahi, I. S.I. S.Al-KofahiZhang, JennyJennyZhangGroeseneken, GuidoGuidoGroeseneken2021-09-292021-09-291996https://imec-publications.be/handle/20.500.12860/1051The enhanced degradation of MOSFETs damaged by hot holesProceedings paper