On the Modeling of Polycrystalline Ferroelectric Thin Films: Landau-Based Models Versus Monte Carlo-Based Models Versus Experiment

Thesberg, MischaMischaThesbergRousselStanojevic, ZlatanZlatanStanojevicBaumgartner, OskarOskarBaumgartnerSchanovsky, FranzFranzSchanovskyKarner, MarkusMarkusKarnerKosina, HansHansKosinaAlam, Md Nur KutubulMd Nur KutubulAlamTruijen, BrechtBrechtTruijenKaczer, BenBenKaczer2022-06-012022-05-182022-05-312022-06-012022-060018-9383WOS:000791712100001https://imec-publications.be/handle/20.500.12860/39834On the Modeling of Polycrystalline Ferroelectric Thin Films: Landau-Based Models Versus Monte Carlo-Based Models Versus ExperimentJournal article10.1109/TED.2022.3167942WOS:000791712100001NEGATIVE CAPACITANCEferroelectric devciesferroelectric filmsMonte Carlo methodssemiconductor device modelling