Tremouilles, DavidDavidTremouillesThijs, StevenStevenThijsMahadeva Iyer, NatarajanNatarajanMahadeva IyerVassilev, VesselinVesselinVassilevRoussel, PhilippePhilippeRousselGroeseneken, GuidoGuidoGroeseneken2021-10-162021-10-162005https://imec-publications.be/handle/20.500.12860/11335Transient voltage overshoot in TLP testing - real or artifactProceedings paper