Leading-edge wide-I/O2 memory probing challenges: TPEG(TM) MEMS solution

Fodor, FerencFerencFodorMarinissen, Erik JanErik JanMarinissenAcconcia, DanieleDanieleAcconciaVallauri, RaffaeleRaffaeleVallauri2021-10-252021-10-252018-06https://imec-publications.be/handle/20.500.12860/30716Leading-edge wide-I/O2 memory probing challenges: TPEG(TM) MEMS solutionProceedings paperhttp://www.swtest.org/swtw_library/2018proc/PDF/S02_03_Fodor_SWTW2018.pdf