Mapping interfacial excess in atom probe data

Felfer, PeterPeterFelferScherrer, BarbaraBarbaraScherrerDemeulemeester, JelleJelleDemeulemeesterVandervorst, WilfriedWilfriedVandervorstCairney, Julie M.Julie M.Cairney2021-10-222021-10-2220150304-3991https://imec-publications.be/handle/20.500.12860/25267Mapping interfacial excess in atom probe dataJournal articlehttp://www.sciencedirect.com/science/article/pii/S0304399115001369