Koelling, SebastianSebastianKoellingHantschel, ThomasThomasHantschelVandervorst, WilfriedWilfriedVandervorst2021-10-162021-10-162007https://imec-publications.be/handle/20.500.12860/12414Conductive diamond probes with electroplated holder chipsJournal article