Ohyama, HidenoriHidenoriOhyamaVanhellemont, JanJanVanhellemontTakami, Y.Y.TakamiSunaga, H.H.SunagaNashiyama, I.I.NashiyamaUwatoko, Y.Y.UwatokoPoortmans, JefJefPoortmansCaymax, MattyMattyCaymax2021-09-302021-09-301997https://imec-publications.be/handle/20.500.12860/2075Degradation of SiGe devices by proton irradiationJournal article