CAD-based defect inspection with optimal ROI selection based on polychromatic X-ray projection images

Presenti, AliceAlicePresentiSijbers, JanJanSijbersden Dekker, Arnold J.Arnold J.den DekkerDe Beenhouwer, JanJanDe Beenhouwer2021-10-272021-10-272019https://imec-publications.be/handle/20.500.12860/33825CAD-based defect inspection with optimal ROI selection based on polychromatic X-ray projection imagesProceedings paperhttps://visielab.uantwerpen.be/sites/default/files/abstract_ict2019_ap_29062018.pdf