Simoen, EddyEddySimoenClaeys, C.C.ClaeysPrivitera, VittorioVittorioPriviteraCoffa, S.S.CoffaLarsen, A. N.A. N.LarsenClauws, P.P.Clauws2021-10-142021-10-142001https://imec-publications.be/handle/20.500.12860/5661High-energy proton radiation induced defects in tin-doped N- tType sSiliconJournal article