Transient voltage overshoot in TLP testing

Tremouilles, DavidDavidTremouillesThijs, StevenStevenThijsRoussel, PhilippePhilippeRousselMahadeva Iyer, NatarajanNatarajanMahadeva IyerVassilev, VesselinVesselinVassilevGroeseneken, GuidoGuidoGroeseneken2021-10-162021-10-162007https://imec-publications.be/handle/20.500.12860/12992Transient voltage overshoot in TLP testing - Real or artifact?Journal article